Thick800 XRF Spectrometer

Model : Thick800


   The Thick800 incorporates Skyray's many year in plating thickness measurement with full-auto software operation, mluti-point testing, software controlling the instrument and movable platform. it is a powerful instrument equipped with special software that is widely applied in plating industries.

Technical Specifications 
Measurable ElementsFrom Sodium to Uranium (76 Element Total)
Precision0.05% to 0.1% Deviation
Tube Voltage5-50KV
Test Time30 Seconds
Ambient Humidity<71%
Ambient Temperature-20 oC to 50 oC
Power input110 to 220 Vac